Publications - Computational X-ray Imaging

60 publications found

Year

All (60) 2004 (5) 2005 (1) 2006 (1) 2007 (2) 2009 (3) 2010 (1) 2011 (1) 2012 (1) 2013 (5) 2014 (3) 2015 (1) 2016 (1) 2017 (3) 2018 (3) 2019 (1) 2020 (8) 2021 (5) 2022 (3) 2023 (2) 2024 (6) 2025 (1)

Uranium Oxide as a Highly Reflective Coating from 100-400 eV

Richard L. Sandberg^†, David D. Allred, Luke J. Bissell^‡, Jed E. Johnson^†, and R. Steven Turley

AIP Conf. Proc. 705, 796-799 (2004).

Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

R. E. Robinson^‡, R. L. Sandberg^†, D. D. Allred, A. L. Jackson, J. E. Johnson^†, W. Evans^†, T. Doughty^‡, … K. Adamson^†, and A. Jacquier^† (1 other authors)

47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.

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Determining Composition of Thin Films of Uranium Oxide by X-Ray Photoelectron Spectroscopy

Kristi Adamson^‡, Shannon Lunt^†, Richard Sandberg^†, Elke Jackson^‡, David Allred, and R. Steven Turley

J. Utah Acad. Sci. 82, 176-186 (2005).

Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

R. E. Robinson‡, R. L. Sandberg†, D. D. Allred, A. L. Jackson, J. E. Johnson†, W. Evans†, T. Doughty‡, … K. Adamson†, and A. Jacquier† (1 other authors)

47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.

A comparison of uranium oxide and nickle as single-layer reflectors from 2.7 to 11.6 nm

Richard L. Sandberg^†, David D. Allred, Jed E. Johnson^†, and R. Steven Turley

Proc. SPIE 5193, 191-203 (2004).