Publications - Computational X-ray Imaging

5 publications found

2004

Year

All (59) 2004 (5) 2005 (1) 2006 (1) 2007 (2) 2009 (3) 2010 (1) 2011 (1) 2012 (1) 2013 (5) 2014 (3) 2015 (1) 2016 (1) 2017 (3) 2018 (3) 2019 (1) 2020 (8) 2021 (5) 2022 (3) 2023 (2) 2024 (6)

Optical properties and application of uranium-based thin films for the extreme ultraviolet and soft x-ray region

Richard L. Sandberg^†, David d. Allred, Shannon Lunt^†, Marie K. Urry^‡, and R. Steven Turley

Proc. SPIE 5538, 84-91 (2004).

Uranium Oxide as a Highly Reflective Coating from 100-400 eV

Richard L. Sandberg^†, David D. Allred, Luke J. Bissell^‡, Jed E. Johnson^†, and R. Steven Turley

AIP Conf. Proc. 705, 796-799 (2004).

Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

R. E. Robinson^‡, R. L. Sandberg^†, D. D. Allred, A. L. Jackson, J. E. Johnson^†, W. Evans^†, T. Doughty^‡, … K. Adamson^†, and A. Jacquier^† (1 other authors)

47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.

Removing Surface Contaminants from Silicon Wafers to Facilitate EUV Optical Characterization

R. E. Robinson‡, R. L. Sandberg†, D. D. Allred, A. L. Jackson, J. E. Johnson†, W. Evans†, T. Doughty‡, … K. Adamson†, and A. Jacquier† (1 other authors)

47th Annual Technical Conference Proceedings, (Dallas, TX, April 2004), Vol. 47, (Society of Vacuum Coaters, Albuquerque, NM, 2004) 368-376.

A comparison of uranium oxide and nickle as single-layer reflectors from 2.7 to 11.6 nm

Richard L. Sandberg^†, David D. Allred, Jed E. Johnson^†, and R. Steven Turley

Proc. SPIE 5193, 191-203 (2004).